Raman spectroscopy has been highlighted as a vital tool for characterizing 2D materials-based van der Waal heterostructures. In this article, we explore its applications in analyzing graphene, TMDs and phospherene.
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Raman spectroscopy is a useful and non-destructive characterization tool to understand the physical and chemical properties of 2D materials. Raman spectroscopy instrumentation involves an excitation laser source, filters, detectors, sample holder and computer-compatible software for human interfacing. Laser sources with different wavelengths, ranging from ultraviolet through the visible to near-infrared could be chosen depending on the application.
The interlayer interaction in the graphene significantly influences their properties. So, the number of layers of graphene could be determined through Raman spectroscopy. Raman 2D peak in graphene is utilized to discriminate between graphene and graphite, which are distinguishable by the number of layers.
The mode was seen as sensitive external stimuli of strain and was seen splitting into two modes when the strain was applied. This splitting increased with the increase in the applied strain, as reported in literature. Analyzing Phosphorene Through Raman Spectroscopy The properties of another two-dimensional material, black phosphorous , can be easily determined through Raman spectroscopy. In 2D monolayer of BP, called phosphorene, have a honeycomb-like structured arrangement of atoms. It is formed when a single phosphorous is connected to three other phosphorous atoms. A weak van der Waals force of attraction is found in between the layers of 2D BP in a stack.
Temperature-dependent Raman spectroscopy is an efficient tool to investigate the thermoelectric properties of 2D materials. It was reported by Zhang et al., that the A1g, B2g and A2g modes of phosphorene are more sensitive to temperature than graphene and MoS2 due to higher mechanical flexibility in few-layered BP.
Wu, J.B., et al. Raman spectroscopy of monolayer and multilayer graphenes. Raman Spectroscopy of Two-Dimensional Materials, pp. 1-27. doi.org/10.1007/978-981-13-1828-3_1.
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